Deep Learning Framework for Real-Time PCB Defect Detection and Automated Segregation

Authors

  • Chiranthan Gowda S. P.
  • Mohammed Affan
  • Pughal P.
  • Veeresha M.
  • Chethan K. S.

Keywords:

E-waste segregation, PCB defect detection, Raspberry Pi 4, Smart manufacturing, YOLOv8

Abstract

Quality control in semiconductor and Printed Circuit Board (PCB) production demands inspection methods that are fast, consistent, and capable of identifying small surface-level faults. Conventional manual checking is difficult to scale and may lead to missed defects when production volume is high. Recent research indicates that computer-vision models, particularly YOLO-based detectors, are suitable for real-time industrial inspection because they can locate and classify objects in a single processing stage. This paper reviews recent work on PCB defect detection, semiconductor inspection, and e-waste sorting, and presents a proposed system that combines YOLOv8, camera input, a Raspberry Pi 4, and a motor-driven conveyor arrangement. The review identifies three gaps in existing work: the lack of a link between detection and physical action, the limited attention to low-cost embedded deployment, and the absence of a reusability decision after defect detection. As the hardware prototype and testing phase are still in progress, the manuscript reports the review findings, system objectives, proposed workflow, expected outcomes, and implementation challenges without claiming experimental results. The proposed system classifies components as reusable or non-reusable and supports automatic segregation for smart manufacturing and e-waste handling. This is a review article with a proposed framework; reusability criteria and an evaluation plan are defined for later experimental validation.

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Published

2026-10-23

How to Cite

Chiranthan Gowda S. P., Mohammed Affan, Pughal P., Veeresha M., & Chethan K. S. (2026). Deep Learning Framework for Real-Time PCB Defect Detection and Automated Segregation. Recent Trends in Semiconductor and Sensor Technology, 1–13. Retrieved from https://www.matjournals.net/engineering/index.php/RTSST/article/view/4342