Chiranthan Gowda S. P., Mohammed Affan, Pughal P., Veeresha M., and Chethan K. S. “Deep Learning Framework for Real-Time PCB Defect Detection and Automated Segregation”. Recent Trends in Semiconductor and Sensor Technology (October 23, 2026): 1–13. Accessed November 1, 2026. https://www.matjournals.net/engineering/index.php/RTSST/article/view/4342.