Chiranthan Gowda S. P., Mohammed Affan, Pughal P., Veeresha M. and Chethan K. S. (2026) “Deep Learning Framework for Real-Time PCB Defect Detection and Automated Segregation”, Recent Trends in Semiconductor and Sensor Technology, pp. 1–13. Available at: https://www.matjournals.net/engineering/index.php/RTSST/article/view/4342 (Accessed: 2 November 2026).