CHIRANTHAN GOWDA S. P.; MOHAMMED AFFAN; PUGHAL P.; VEERESHA M.; CHETHAN K. S. Deep Learning Framework for Real-Time PCB Defect Detection and Automated Segregation. Recent Trends in Semiconductor and Sensor Technology, [S. l.], p. 1–13, 2026. Disponível em: https://www.matjournals.net/engineering/index.php/RTSST/article/view/4342. Acesso em: 2 nov. 2026.